$Tem diffraction pattern analysis$

$tem diffraction pattern analysis$

Several active pharmaceutical ingredients (APIs) are industrially produced as nanocrystalline or amorphous powders (Prasad et al, 2010) through technologies such as cryomilling, melt extrusion, spray drying or rapid precipitation in the presence ofД¬rystallization inhibitors. Examples include metallic nanoparticles and nanomaterials organic pigments, where color may depend on crystallite size organic semiconductors, where optical and electrical properties depend on crystallinity and pharmaceutical compounds, where nanocrystalline and amorphous materials generally show increased solubility and bioavailability (Kim et al, 2008, Yu, 2001). This is true for inorganic compounds, organic or organometallic materials, and metal-organic complexes. Amorphous and nanocrystalline materials, including nanostructured bulk and nanoporous materials, have different properties than crystalline bulk materials. G01N2223/418- Imaging electron microscope.G01N2223/345- Accessories, mechanical or electrical features mathematical transformations on beams or signals, e.g.G01N2223/30- Accessories, mechanical or electrical features.

$tem diffraction pattern analysis$

G01N2223/00- Investigating materials by wave or particle radiation.

low energy electron diffraction method or reflection high energy electron diffraction method

G01N23/20058- Measuring diffraction of electrons, e.g.

for investigating non-crystalline materials by using reflection of the radiation by the materials for investigating crystal structure by using scattering of the radiation by the materials, e.g. X-rays or neutrons, not covered by groups G01N3/00 вЂ“ G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g.

G01N23/20- Investigating or analysing materials by the use of wave or particle radiation, e.g.

G01N23/00- Investigating or analysing materials by the use of wave or particle radiation, e.g.

G01N- INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES.

H01J37/26- Electron or ion microscopes Electron or ion diffraction tubes.

for the purpose of examination or processing thereof

H01J37/00- Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g.

H01J- ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS.

Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.) Filing date Publication date Priority to US201161510280P priority Critical Priority to US201261635685P priority Application filed by Columbia University of New York filed Critical Columbia University of New York Priority to PCT/US2012/047568 priority patent/WO2013013134A2/en Publication of EP2734836A2 publication Critical patent/EP2734836A2/en Publication of EP2734836A4 publication Critical patent/EP2734836A4/en Status Withdrawn legal-status Critical Current Links Original Assignee Columbia University of New York Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.) Schmidt Current Assignee (The listed assignees may be inaccurate.

$tem diffraction pattern analysis$

( en Inventor Simon Billinge Christopher FARROW Mercouri Kanatzidis Tatiana E. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.) Withdrawn Application number EP12814396.3A Other languages German ( de) Info Publication number EP2734836A2 EP2734836A2 EP12814396.3A EP12814396A EP2734836A2 EP 2734836 A2 EP2734836 A2 EP 2734836A2 EP 12814396 A EP12814396 A EP 12814396A EP 2734836 A2 EP2734836 A2 EP 2734836A2 Authority EP European Patent Office Prior art keywords sample electron diffraction pattern diffraction data Prior art date Legal status (The legal status is an assumption and is not a legal conclusion. Google Patents Method of collecting and processing electron diffraction data Google Patents EP2734836A2 - Method of collecting and processing electron diffraction data EP2734836A2 - Method of collecting and processing electron diffraction data

$Tem diffraction pattern analysis$